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Products

  • » Werth Messtechnik GmbH
    • » CMMs
      • -› VideoCheck® S 250/400
      • -› VideoCheck® FB
      • -› VideoCheck® UA 400
      • -› VideoCheck HA & UA
      • -› ScopeCheck® 300/400
      • -› ScopeCheck® FB DZ
      • -› ScopeCheck MB
      • -› TomoScope XS
      • -› TomoScope® S
      • -› TomoScope XS FOV
      • -› FlatScope® 400/650
      • -› Quick Inspect / MT
      • -› EasyScope
    • » Tools & Shafts
      • -› ScopeCheck®V
      • -› VideoCheck V HA
      • -› NanoMatic
      • -› ShaftScope CNC
    • » Sensors
      • -› Werth Image Processing IP
      • -› Werth Laser Probe WLP
      • -› Werth Laser Line Probe LLP
      • -› Werth Chromatic Focus Probe Sensor CFP
      • -› Werth Chromatic Focus Line Sensor CFL
      • -› Werth Chromatic Focus Zoom CFZ
      • -› Werth Nano Focus Probe NFP
      • -› Werth Contour Probe WCP
      • -› Werth Fiber Probe WFP/S
      • -› Werth 3D Fiber Probe WFP
      • -› Werth Interferometer Probe WIP
      • -› TP200
      • -› SP25M
      • -› SP80
    • » Software
      • -› WinWerth
      • -› Werth OnTheFly
      • -› Werth HDR Scan
      • -› Werth 3D Patch
    • » Accessories
      • -› Werth Right Angle Optics
      • -› Rotary Tilt Axis
    • » Newsletter
      • -› 2025_Multisensor
      • -› 2024 Newsletter Multisensor
      • -› 2023 Newsletter Multisensor
      • -› 2019 newsletter
      • -› 2018 Newsletter
      • -› 2017 Newsletter
      • -› 2016 Newsletter
      • -› 2015 Newsletter May
      • -› 2015 Newsletter Jan
      • -› 2014 Newsletter
      • -› Practical Tip -3
      • -› Practical Tip -2
      • -› Practical Tip -1
      • -› Practical Tip
  • » Hexagon Manufacturing Intelligence
    • -› SF 7.10.7
    • -› SF 4.5.4
    • -› SF TIGO
    • -› PC-DMIS
    • -› Explorer Performance
    • -› Captura 322
  • » Topcon Technohouse Corp.
    • -› SR-5000 series
    • -› SR series
    • -› UA series
    • -› BM-series
  • » Motic
    • » Industrial Microscope
      • » Stero Zoom Microscope
        • -› SMZ-171 TP
        • -› SMZ 171 TLED (ESD)
        • -› SMZ-171 BLED
        • -› SMZ-160
        • -› SM7 (CMO Optics)
        • -› SM7 Trio
        • -› SFC-11
      • » Metallurgical Microscope
        • -› BA310MET
        • -› PA53MET
        • -› PA80MET
        • -› PA120MET
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  • » Seven Ocean
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  • » Renishaw
Products » Werth Messtechnik GmbH » Software » Werth HDR Scan

Werth HDR Scan

Werth HDR Scan

ยี่ห้อ : Werth



High Precision for Quick Measurements of Under Continuous Motion

A quick “in the image” measurement in the field of view of the image processing sensor has the same advantages for large workpieces as it does for small, however the measurement precision is not as high as it could be due to the limited magnification when measuring with a large field of view. Raster Scanning HD, patented by Werth Messtechnik, makes it possible to quickly capture a complete image of a large area with high precision.

This process is unparalleled in the market: the image processing sensor takes high frequency images of moving workpieces without any loss of precision. The individual images taken by the camera during the measurement process are superimposed using a patented re-sampling process to create one overall image. To accomplish this, WinWerth® starts by creating a pixel raster the size of the final image. The grayscale values for the individual pixels are calculated using the neighboring pixel amplitudes of all overlapping images. This creates an extremely high resolution overall image of the selected measurement area with up to 4000 megapixels (4 gigapixels). In addition to the software correction of the machine geometry and optics, positioning uncertainty is minimized though the superimposition of images from different locations.

On the one hand, Raster Scanning HD attains a large degree of precision through high magnification measuring, and averaging over several images improves the signal-noise ratio. On the other hand, the continuous movement of the sensor provides for high measurement speeds.


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